X-ray diffraction measurement of segregation-induced interface broadening in In[sub x]Ga[sub 1−x]As/GaAs superlattices
Yashar, P., Pillai, M. R., Mirecki-Millunchick, J., Barnett, S. A.Volume:
83
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.366930
File:
PDF, 348 KB
english, 1998