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[IEEE 2009 IEEE International Conference on IC Design and Technology (ICICDT) - Austin, TX, USA (2009.05.18-2009.05.20)] 2009 IEEE International Conference on IC Design and Technology - An on-chip process control monitor for process variability measurements in nanometer technologies
Klass, Fabian, Jain, Ashish, Hess, GregYear:
2009
Language:
english
DOI:
10.1109/icicdt.2009.5166296
File:
PDF, 1.55 MB
english, 2009