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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Lower trigger voltage design for ESD protection device applied in PMIC application
He, Yi-Ning, Chen, Lu-An, Tang, Tien-Hao, Su, Kuan-ChengYear:
2014
Language:
english
DOI:
10.1109/irps.2014.6861134
File:
PDF, 400 KB
english, 2014