An Analytical Subthreshold Model of Polycrystalline Silicon...

IEEE Transactions on Electron Devices 2014 / 03 Vol. 61; Iss. 3

An Analytical Subthreshold Model of Polycrystalline Silicon Thin-Film Transistors Based on Meyer-Neldel Rule

Zhou, Xiaoliang, Wang, Mingxiang
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2301451
Date:
March, 2014
File:
PDF, 955 KB
english, 2014
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