[IEEE European Test Symposium (ETS'05) - Tallinn, Estonia...

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[IEEE European Test Symposium (ETS'05) - Tallinn, Estonia (22-25 May 2005)] European Test Symposium (ETS'05) - Path-Oriented Transition Fault Test Generation Considering Operating Conditions

Seshadri, B., Pomeranz, I., Reddy, S.M., Kundu, S.
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Year:
2005
Language:
english
DOI:
10.1109/ets.2005.31
File:
PDF, 103 KB
english, 2005
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