[IEEE Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference - Dayton, OH, USA (21-24 Sept. 1992)] Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference - A system for fault diagnosis in electronic circuits using thermal imaging
Allred, L.G., Kelly, G.E.Year:
1992
Language:
english
DOI:
10.1109/AUTEST.1992.270076
File:
PDF, 291 KB
english, 1992