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[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Interface engineering for thermal disturb immune phase change memory technology

Redaelli, A., Boniardi, M., Ghetti, A., Russo, U., Cupeta, C., Lavizzari, S., Pirovano, A., Servalli, G.
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Year:
2013
Language:
english
DOI:
10.1109/iedm.2013.6724724
File:
PDF, 1.81 MB
english, 2013
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