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[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - On p-n junction depletion capacitance parameter extraction strategies
Milovanovic, Vladimir, van der Toorn, RamsesYear:
2010
Language:
english
DOI:
10.1109/miel.2010.5490528
File:
PDF, 260 KB
english, 2010