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[IEEE 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Boise, ID, USA (2012.08.5-2012.08.8)] 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Automated wafer-level measurement of LDMOS reverse recovery parameters
Rodriguez Latorre, Jose A., Jimenez, Manuel A., Palomera, RogelioYear:
2012
Language:
english
DOI:
10.1109/mwscas.2012.6292209
File:
PDF, 339 KB
english, 2012