Combining Ability Analysis for Bacterial Leaf Spot...

Journal of Crop Improvement 2014 / 05 Vol. 28; Iss. 3

Combining Ability Analysis for Bacterial Leaf Spot Resistance, Leaf Yield, and Agronomic Traits in Mulberry Clones

Banerjee, Rita, Chattopadhyay, S., Das, N. K., Doss, S. G., Saha, A. K., Kumar, S. Nirmal
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Volume:
28
Language:
english
Journal:
Journal of Crop Improvement
DOI:
10.1080/15427528.2013.869519
Date:
May, 2014
File:
PDF, 530 KB
english, 2014
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