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[IEEE 34th Design Automation Conference - Anaheim CA (June 9-13, 1997)] Proceedings of the 34th Design Automation Conference - Automatic Generation Of Synchronous Test Patterns For Asynchronous Circuits
Roig, O., Cortadella, J., Peiia, M.A., Pastor, E.Year:
1997
Language:
english
DOI:
10.1109/dac.1997.597220
File:
PDF, 747 KB
english, 1997