New insights into fully-depleted SOI transistor response...

IEEE Transactions on Nuclear Science 2000 / 6 Vol. 47; Iss. 3

New insights into fully-depleted SOI transistor response after total-dose irradiation

Schwank, J.R., Shaneyfelt, M.R., Dodd, P.E., Burns, J.A., Keast, C.L., Wyatt, P.W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
47
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.856487
Date:
June, 2000
File:
PDF, 702 KB
english, 2000
Conversion to is in progress
Conversion to is failed