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[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Sensitivity Analysis for Fault-analysis and Tolerance in RF Front-end Circuitry
Das, Tejasvi, Mukund, P.R.Year:
2007
Language:
english
DOI:
10.1109/date.2007.364473
File:
PDF, 404 KB
english, 2007