[IEEE 2010 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Monterey, CA, USA (2010.10.12-2010.10.15)] 2010 IEEE Nanotechnology Materials and Devices Conference - Improvement of reliability characteristics using the N2 implantation in SOHOS flash memory
Park, Jeong-Gyu, Oh, Jae-Sub, Yang, Seung-Dong, Jeong, Kwang-Seok, Kim, Yu-Mi, Yun, Ho-Jin, Lee, Hi-Deok, Lee, Ga-WonYear:
2010
Language:
english
DOI:
10.1109/nmdc.2010.5652151
File:
PDF, 1.08 MB
english, 2010