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[IEEE RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) - St. Malo, France (13-16 Sept. 1993)] RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) - Use of 2D simulations to study parameters influence on SEB occurrence in n-channel MOSFETs
Roubaud, F., Dachs, C., Palau, J.-M., Gasiot, J., Tastet, P.Year:
1994
Language:
english
DOI:
10.1109/radecs.1993.316561
File:
PDF, 626 KB
english, 1994