[IEEE 2008 31st International Spring Seminar on Electronics...

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[IEEE 2008 31st International Spring Seminar on Electronics Technology (ISSE) - Budapest, Hungary (2008.05.7-2008.05.11)] 2008 31st International Spring Seminar on Electronics Technology - Material characterization with the ultrasonic microscope

Gust, Norbert, Kuhnicke, Elfgard, Breuer, Dirk
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Year:
2008
Language:
english
DOI:
10.1109/isse.2008.5276445
File:
PDF, 592 KB
english, 2008
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