Fast Parallel Kriging-Based Stepwise Uncertainty Reduction With Application to the Identification of an Excursion Set
Chevalier, Clément, Bect, Julien, Ginsbourger, David, Vazquez, Emmanuel, Picheny, Victor, Richet, YannVolume:
56
Language:
english
Journal:
Technometrics
DOI:
10.1080/00401706.2013.860918
Date:
October, 2014
File:
PDF, 661 KB
english, 2014