![](/img/cover-not-exists.png)
X‐ray microscopy at BESSY
Schmahl, G., Rudolph, D., Niemann, B., Guttmann, P., Thieme, J., Wiesemann, U., Schneider, G., Eimuller, T., Fischer, P., Schutz, G.Volume:
16
Language:
english
Journal:
Synchrotron Radiation News
DOI:
10.1080/08940880308603015
Date:
May, 2003
File:
PDF, 850 KB
english, 2003