X‐ray microscopy at BESSY

X‐ray microscopy at BESSY

Schmahl, G., Rudolph, D., Niemann, B., Guttmann, P., Thieme, J., Wiesemann, U., Schneider, G., Eimuller, T., Fischer, P., Schutz, G.
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Volume:
16
Language:
english
Journal:
Synchrotron Radiation News
DOI:
10.1080/08940880308603015
Date:
May, 2003
File:
PDF, 850 KB
english, 2003
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