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[IEEE 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Glasgow, United Kingdom (2013.09.3-2013.09.5)] 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Evaluation of spin lifetime in strained UT2B silicon-on-insulator MOSFETs
Osintsev, Dmitri, Sverdlov, Viktor, Selberherr, SiegfriedYear:
2013
Language:
english
DOI:
10.1109/sispad.2013.6650618
File:
PDF, 793 KB
english, 2013