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[IEEE 25th International Reliability Physics Symposium - San Diego, CA, USA (1987.04.7-1987.04.9)] 25th International Reliability Physics Symposium - Analysis of a Silver Substrate, Gold-Silicon Preform, Die Attach System
Nolder, Richard L., Malone, David N.Year:
1987
Language:
english
DOI:
10.1109/irps.1987.362184
File:
PDF, 9.36 MB
english, 1987