[IEEE 2006 Multiconference on Electronics and Photonics - Guanajuato, Mexico (2006.11.7-2006.11.10)] 2006 Multiconference on Electronics and Photonics - A semi-spherical irradiance profiles meter used as a quality control device
Gonzalez-Roman, A., Tecpoyotl-Torres, M., Escobedo-Alatorre, J., Pal-Verma, S., Torres-Cisneros, M., Sanchez-Mondragon, J.Year:
2006
Language:
english
DOI:
10.1109/mep.2006.335675
File:
PDF, 627 KB
english, 2006