[IEEE Proceedings of the 2005, American Control Conference,...

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[IEEE Proceedings of the 2005, American Control Conference, 2005. - Portland, OR, USA (June 8-10, 2005)] Proceedings of the 2005, American Control Conference, 2005. - Method of combining multi-class SVMs using dempster-shafer theory and its application

Zhonghui Hu,, Yuangui Li,, Yunze Cai,, Xiaoming Xu,
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Year:
2005
Language:
english
DOI:
10.1109/acc.2005.1470254
File:
PDF, 211 KB
english, 2005
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