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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains
Lagos-Benites, J., Appello, D., Bernardi, P., Grosso, M., Ravotto, D., Sanchez, E., Reorda, M. SonzaYear:
2007
Language:
english
DOI:
10.1109/dft.2007.47
File:
PDF, 451 KB
english, 2007