Single-Event Effect Performance of a Commercial Embedded ReRAM
Chen, Dakai, Kim, Hak, Phan, Anthony, Wilcox, Edward, LaBel, Kenneth, Buchner, Stephen, Khachatrian, Ani, Roche, NicolasVolume:
61
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2014.2361488
Date:
December, 2014
File:
PDF, 1.62 MB
english, 2014