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[IEEE Factory Automation (ETFA 2011) - Toulouse, France (2011.09.5-2011.09.9)] ETFA2011 - Using ontologies to capture and structure knowledge about disruptions in manufacturing systems: An immune driven approach
Darmoul, Saber, Pierreval, Henri, Hajri-Gabouj, SoniaYear:
2011
Language:
english
DOI:
10.1109/etfa.2011.6059033
File:
PDF, 1.12 MB
english, 2011