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Electron transport in niobium-silicon-niobium structures
Heslinga, D.R., Van Huffelen, W.M., Klapwijk, T.M.Volume:
27
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.133908
Date:
March, 1991
File:
PDF, 385 KB
english, 1991