[IEEE 2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - San Jose, CA, USA (2011.10.23-2011.10.26)] 2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems - New interconnect evaluation metric for high-speed IO
Moon, Se-Jung, Acar, Erkan, Mellitz, RichardYear:
2011
Language:
english
DOI:
10.1109/epeps.2011.6100192
File:
PDF, 469 KB
english, 2011