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[IEEE 2013 IEEE International Symposium on Circuits and Systems (ISCAS) - Beijing (2013.5.19-2013.5.23)] 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013) - Simultaneous gate sizing and Vt assignment using Fanin/Fanout ratio and Simulated Annealing
Reimann, Tiago, Posser, Gracieli, Flach, Guilherme, Johann, Marcelo, Reis, RicardoYear:
2013
Language:
english
DOI:
10.1109/iscas.2013.6572398
File:
PDF, 507 KB
english, 2013