[IEEE 2013 5th IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2013.05.26-2013.05.29)] 2013 5th IEEE International Memory Workshop - A 58nm gate length 512Mb B4-Flash memory - Verification of excellent scalability of B4-Flash memory -
Shimizu, S., Shukuri, S., Ogura, T., Ajika, N., Arai, H., Kobayashi, K., Nakashima, M., Iwamoto, K., Morikawa, G., Tanaka, B., Toyonaga, M., Takeda, H., Wada, K., Mifuji, M.Year:
2013
Language:
english
DOI:
10.1109/imw.2013.6582124
File:
PDF, 611 KB
english, 2013