Physics-of-Failure, Condition Monitoring, and Prognostics...

IEEE Transactions on Power Electronics 2015 / 5 Vol. 30; Iss. 5

Physics-of-Failure, Condition Monitoring, and Prognostics of Insulated Gate Bipolar Transistor Modules: A Review

Oh, Hyunseok, Han, Bongtae, McCluskey, Patrick, Han, Changwoon, Youn, Byeng D.
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Volume:
30
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2014.2346485
Date:
May, 2015
File:
PDF, 676 KB
english, 2015
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