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[IEEE IEEE Conference on Nuclear Science Symposium and Medical Imaging - Orlando, FL, USA (25-31 Oct. 1992)] IEEE Conference on Nuclear Science Symposium and Medical Imaging - Radiation hardness measurements on bipolar test structures and an amplifier-comparator circuit

Cartiglia, N., Dorfan, D.E., Pitzl, D., Rahn, J., Rowe, W.A., Sadrozinski, H.F.-W., Spencer, E.N., Wilde, M., Turala, M., Dabrowski, W.
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Year:
1992
Language:
english
DOI:
10.1109/nssmic.1992.301437
File:
PDF, 249 KB
english, 1992
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