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[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Electron capture and emission at interface states in As-oxidized and NO-annealed SiO2/4H-SiC
Xudong Chen,, Sarit Dhar,, Isaacs-Smith, Tamara, Williams, John R., Feldman, Leonard C., Mooney, Patricia M.Year:
2007
Language:
english
DOI:
10.1109/isdrs.2007.4422264
File:
PDF, 245 KB
english, 2007