[IEEE 2010 IEEE Radar Conference - Arlington, VA, USA...

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[IEEE 2010 IEEE Radar Conference - Arlington, VA, USA (2010.05.10-2010.05.14)] 2010 IEEE Radar Conference - SKP-shrinkage estimator for SAR multi-baselines applications

Rucci, Alessio, Tebaldini, Stefano, Rocca, Fabio
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Year:
2010
Language:
english
DOI:
10.1109/radar.2010.5494531
File:
PDF, 2.05 MB
english, 2010
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