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[IEEE 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2012.09.19-2012.09.21)] 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Structural study and sensitivity measurements of ZnO based ammonia (NH3) sensor
Ahmad, S., Sin, N. D. Md, Mamat, M. H., Salina, M., Berhan, M. N., Rusop, M.Year:
2012
Language:
english
DOI:
10.1109/smelec.2012.6417235
File:
PDF, 2.18 MB
english, 2012