An innovative modelization of loss mechanism in silicon...

An innovative modelization of loss mechanism in silicon integrated inductors

Arcioni, P., Castello, R., Perregrini, L., Sacchi, E., Svelto, F.
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Volume:
46
Language:
english
Journal:
IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
DOI:
10.1109/82.809531
Date:
January, 1999
File:
PDF, 349 KB
english, 1999
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