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[IEEE 1998 GaAs Reliability Workshop. Proceedings - Atlanta, GA, USA (1 Nov. 1998)] 1998 GaAs Reliability Workshop. Proceedings (Cat. No.98EX219) - Life testing of GaAs/AlGaAs heterojunction bipolar transistors
Mittereder, J.A., Roussos, J.A., Anderson, W.T.Year:
1998
Language:
english
DOI:
10.1109/gaasrw.1998.768034
File:
PDF, 331 KB
english, 1998