[IEEE 2008 IEEE Instrumentation and Measurement Technology...

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[IEEE 2008 IEEE Instrumentation and Measurement Technology Conference - I2MTC 2008 - Victoria, BC, Canada (2008.05.12-2008.05.15)] 2008 IEEE Instrumentation and Measurement Technology Conference - Uncertainty Analysis of Impedance Measurements Using DSP Implemented Ellipse Fitting Algorithms

Ramos, Pedro M., Janeiro, Fernando M., Tlemcani, Mouhaydine, Serra, A. Cruz
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Year:
2008
Language:
english
DOI:
10.1109/imtc.2008.4547080
File:
PDF, 1.10 MB
english, 2008
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