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[IEEE 2010 Third International Conference on Software Testing, Verification and Validation - Paris, France (2010.04.6-2010.04.10)] 2010 Third International Conference on Software Testing, Verification and Validation - The Effectiveness of Regression Testing Techniques in Reducing the Occurrence of Residual Defects
Nagahawatte, Panduka, Do, HyunsookYear:
2010
DOI:
10.1109/icst.2010.57
File:
PDF, 1.93 MB
2010