[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Investigating the limits of AVF analysis in the presence of multiple bit errors
Maniatakos, Michail, Michael, Maria K., Makris, YiorgosYear:
2013
Language:
english
DOI:
10.1109/iolts.2013.6604050
File:
PDF, 1.47 MB
english, 2013