[IEEE 2013 IEEE 19th International On-Line Testing...

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[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Investigating the limits of AVF analysis in the presence of multiple bit errors

Maniatakos, Michail, Michael, Maria K., Makris, Yiorgos
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Year:
2013
Language:
english
DOI:
10.1109/iolts.2013.6604050
File:
PDF, 1.47 MB
english, 2013
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