[IEEE 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsin Chu, Taiwan (2010.04.26-2010.04.29)] Proceedings of 2010 International Symposium on VLSI Design, Automation and Test - Digitally-assisted analog designs for submicron CMOS technology
Lai, Fang-shi, Lin, Yung-Fu, Weng, Adams, Hsueh, Kevin, Hsueh, Fu-LungYear:
2010
Language:
english
DOI:
10.1109/vdat.2010.5496689
File:
PDF, 426 KB
english, 2010