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Research of NIR exposure levels in diagnostic MRI environments
Rodriguez, Conrado J., Vanella, Oscar R., Bruni, Rodrigo G., Taborda, Ricardo A. M.Volume:
11
Journal:
IEEE Latin America Transactions
DOI:
10.1109/tla.2013.6502823
Date:
February, 2013
File:
PDF, 483 KB
2013