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[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - Investigation of interconnect effects in a transimpedance amplifier
Xiaomeng Shi,, Zhenghao Lu,, Jianguo Ma,, Erping Li,, Kiat Seng Yeo,, Manh Anh Do,Year:
2006
Language:
english
DOI:
10.1109/emczur.2006.215002
File:
PDF, 815 KB
english, 2006