![](/img/cover-not-exists.png)
[IEEE 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsin Chu, Taiwan (2010.04.26-2010.04.29)] Proceedings of 2010 International Symposium on VLSI Design, Automation and Test - 150mV sub-threshold Asynchronous multiplier for low-power sensor applications
Crop, Joseph, Fairbanks, Scott, Pawlowski, Robert, Chiang, PatrickYear:
2010
Language:
english
DOI:
10.1109/vdat.2010.5496737
File:
PDF, 439 KB
english, 2010