The depletion depth of high resistivity X-ray CCDs
Prigozhin, G., Gendreau, K., Bautz, M., Burke, B., Ricker, G.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.682658
Date:
June, 1998
File:
PDF, 855 KB
english, 1998