[IEEE Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Linz, Austria (2011.04.18-2011.04.20)] 2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Impact of VDMOS source metallization ageing in 3D FEM wire lift off modeling
Marcault, E., Azoui, T., Tounsi, P., Breil, M., Bourennane, A., Dupuy, P.Year:
2011
Language:
english
DOI:
10.1109/esime.2011.5765828
File:
PDF, 1.63 MB
english, 2011