[IEEE 2006 SICE-ICASE International Joint Conference - Busan Exhibition & Convention Center-BEXCO, Busan, Korea (2006.10.18-2006.10.21)] 2006 SICE-ICASE International Joint Conference - Supervised Learning for Object Classification from Image and RFID Data
Shirasaka, Yohei, Yairi, Takehisa, Kanazaki, Hirofumi, Shibata, Junichi, Machida, KazuoYear:
2006
Language:
english
DOI:
10.1109/sice.2006.315597
File:
PDF, 4.40 MB
english, 2006