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[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - MAPG: Memory access power gating
Kwangok Jeong,, Kahng, A. B., Seokhyeong Kang,, Rosing, T. S., Strong, R.Year:
2012
Language:
english
DOI:
10.1109/date.2012.6176651
File:
PDF, 1.78 MB
english, 2012