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Environmental qualification testing and failure analysis of embedded resistors
Salzano, L.J., Wilkinson, C., Sandborn, P.A.Volume:
28
Language:
english
Journal:
IEEE Transactions on Advanced Packaging
DOI:
10.1109/tadvp.2005.848387
Date:
August, 2005
File:
PDF, 3.27 MB
english, 2005