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[IEEE 6th International Conference on Optimization of Electrical and Electronic Equipments - Brasov, Romania (May 14-15, 1998)] Proceedings of the 6th International Conference on Optimization of Electrical and Electronic Equipments - The Reliability of Semiconductor Devices: An Overview
Bazu, M.Volume:
3
Year:
1998
Language:
english
DOI:
10.1109/optim.1998.708047
File:
PDF, 487 KB
english, 1998