[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices
Furbock, C., Seliger, N., Pogany, D., Litzenberger, M., Gornik, E., Stecher, M., Gosser, H., Werner, W.Year:
1998
Language:
english
DOI:
10.1109/iedm.1998.746451
File:
PDF, 443 KB
english, 1998